108-12057
3.5.
Test Requirem ents and Procedures Sum m ary
Test Description
Exam ination of product.
Low level contact resistance.
Contact resistance.
Insulation resistance.
Requirem ent
Specim ens shall be free of burrs
and all contact edges except for the
wire-wrap tail shall be free of sharp
edges. No evidence of other
physical dam age or defects that
would im pair norm al function.
ELECTRICAL
1 ohm m axim um .
8 m illiohm s m axim um .
25,000 m egohm s m inim um .
Procedure
Visual inspection.
Subject each pair of m ated contacts
to 1 m illiam pere m axim um and 20
m illivolts m axim um open circuit
voltage.
See Figure 3.
MIL-STD-202, Method 307.
Measure contact resistance across
each pair of m ated contacts using a
test current of 1 am pere DC.
See Figure 3.
MIL-STD-202, Method 302, Test
Condition B, 500 volts DC.
Test between all contacts and
between insulated contacts and
conductive m ounting plate, if
applicable.
Dielectric withstanding voltage.
One m inute hold with no breakdown MIL-STD-202, Method 301.
or flashover.
1,000 volts AC at sea level.
Test between all contacts and
between insulated contacts and
conductive m ounting plate, if
applicable.
Current overload.
See Note.
MECHANICAL
Subject series wired m ated contacts
to a DC current overload of 125% of
rated current (3.75 am peres) for a
period of 2 hours, im m ediately
followed by an increase to 150% of
rated current (4.5 am peres) for 5
m inutes, then current off.
Vibration.
No discontinuities of 1 m icrosecond MIL-STD-202, Method 204, Test
or longer duration.
See Note.
Condition B.
Subject specim ens to 10 to 2,000
Hz.
Physical shock.
No discontinuities of 1 m icrosecond MIL-STD-202, Method 213, Test
Rev E
or longer duration.
See Note.
Figure 1 (continued)
Condition B.
2 of 7
相关PDF资料
118438-1 CONN RCPT 53POS .100 GOLD
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1217001-1 CONN RCPT/TAB FAST 20-16AWG .187
1217002-1 CONN UNINSUL TAB 0.250
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